Tungsten Filament Desktop Sem
Code: DEM-S100
Used to industrial inspection, functional inorganic materials, fiber testing, chemical testing, botanical analysis, life sciences, ternary lithium batteries, pharmaceutical testing, chemical and metallic materials, resistance testing, alumina thin films, metal tips, DBC ceramic substrates, monocrystalline silicon micropowder, metal spheres, pharmaceutical packaging materials, GaN materials, etc.
The sample stage features beam deceleration mode, enabling real-time observation of weakly conductive samples without gold coating
The oversized sample chamber supports integration of multiple in-situ platforms for diverse experimental needs, with built-in vibration isolation
Software modules include auto brightness/contrast, auto-focus, auto stigmation, and image stitching
Compatible with Oxford and Bruker EDS systems for qualitative and quantitative analysis across elements B (5) to Cf (98), featuring real-time spectral comparison and intelligent report generation
| Code | Resolution | Magnification | Accelerating voltage | Sample chamber |
|---|---|---|---|---|
| DEM-S100 | 4nm | 25X~300, 000X | 3kV~20 kV continuously adjustable, 1kV step (optional high-end version up to 30kV) | 185×176×125mm, with optical camera navigation |
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